Nanometer undulations on CaF2 cleaved surfaces observed by atomic force microscopy

Scripta Materialia

Volumn 34, Issue 11, 1996, Pages 1673-1678

  Coupeau, C ^a   Small, M K ^a   Junqua, N ^a   Grilhe, J ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRYSTAL SYMMETRY; GRAIN BOUNDARIES; INTERFEROMETRY; MORPHOLOGY; SINGLE CRYSTALS; SURFACES; X RAY CRYSTALLOGRAPHY;

CALCIUM FLUORIDE; INTERFEROMETRIC DEFLECTION DETECTOR; NANOMETER UNDULATIONS; SILICON NITRIDE CANTILEVERS;

CALCIUM COMPOUNDS;

EID: 0030174448     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/1359-6462(96)00058-9     Document Type: Article

References (7)

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3. S. Timoshenko and J. N. Goodier, Theory of elasticity, McGraw-Hill (1951).
4. J.P. Hirth and J. Lothe, Theory of Dislocations (John Wiley & Sons, New York, 1982) p. 733.
5. S. Amelinckx and W. Dekeyser, The structure and properties of grain boundaries, Solid State Physics, 8, 325 (1959).
6. C. Elbaum, Progress in Metal Physics (Pergamon Press, New York), 8, pp 203-253 (1959).
7. S. Amelinckx, Acta Metallurgica, 2 (1954).