Effect of tip electronic states on molecular NO images

Surface Science

Volumn 355, Issue 1-3, 1996, Pages

  Xu, H ^a   Simon Ng, K Y ^a  

^a Wayne State University   (United States)

Author keywords

Carbon monoxide; Nitric oxide; Rhodium; Scanning tunneling microscopy

Indexed keywords

CARBON MONOXIDE; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; PRESSURE EFFECTS; RHODIUM; SCANNING TUNNELING MICROSCOPY;

NITRIC OXIDE; TIP EFFECTS;

NITROGEN OXIDES;

EID: 0030173834     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00313-5     Document Type: Article

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