A multiscale assembly inspection algorithm

IEEE Robotics and Automation Magazine

Volumn 3, Issue 2, 1996, Pages 15-22

  Khawaja, Khalid W ^a,b,d   Maciejewski, Anthony A ^b,e,f   Tretter, Daniel ^b,c,d,g,h,i   Bouman, Charles A ^{b,d,j,k,l,m,n,o}  

^a Electronic Data Systems   (United States)

^b PURDUE UNIVERSITY   (United States)

^c HEWLETT PACKARD COMPANY   (United States)

^d IEEE

^e OHIO STATE UNIVERSITY   (United States)

^f HITACHI LTD   (Japan)

^g ROSE HULMAN INSTITUTE OF TECHNOLOGY   (United States)

^h AEROSPACE CORPORATION   (United States)

ⁱ HEWLETT PACKARD LABORATORIES   (United States)

^j UNIVERSITY OF PENNSYLVANIA   (United States)

^k UNIVERSITY OF CALIFORNIA   (United States)

^l MIT LINCOLN LABORATORY   (United States)

^m PRINCETON UNIVERSITY   (United States)

ⁿ Sch of Elec and Comp Engineering

^o NEC CORPORATION   (Japan)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; AUTOMATION; COMPUTER AIDED DESIGN; COMPUTER GRAPHICS; COMPUTER VISION; CONCURRENT ENGINEERING; DATA STRUCTURES; DATABASE SYSTEMS; ERROR DETECTION; IMAGE PROCESSING; INSPECTION; OBJECT RECOGNITION;

ASSEMBLY INSPECTION SYSTEM; AUTOMATED ASSEMBLY; COMPUTER GENERATED SYNTHETIC IMAGES; EXPECTATION MAXIMIZATION ALGORITHM; LOG LIKELIHOOD RATIO; MULTIRESOLUTION HAAR TRANSFORM; MULTISCALE OBJECT DETECTION; STOCHASTIC OBJECT MODEL; TEMPLATE MATCHING; X RAY TRACING;

ALGORITHMS;

EID: 0030173319     PISSN: 10709932     EISSN: None     Source Type: Journal    
DOI: 10.1109/100.511780     Document Type: Article

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