The influence of annealing processes on the structural, compositional and electro-optical properties of CuIn0.75Ga0.25Se2 thin films

Journal of Materials Science: Materials in Electronics

Volumn 7, Issue 3, 1996, Pages 213-219

  Ahmed, E ^a  

^a HEALTH AND SAFETY EXECUTIVE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; COPPER COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTROOPTICAL EFFECTS; SCANNING ELECTRON MICROSCOPY; SELENIUM; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

FULL WAVE HALF MAXIMUM VALUE; SELECTED FLASH EVAPORATED SAMPLES;

THIN FILMS;

EID: 0030172899     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00133118     Document Type: Article

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