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Volumn 52, Issue 6, 1996, Pages 1346-1348

Tetrakis(μ3-2-methyl-5-thienyl)tetrakis-(diethyl ether-O)-tetrahedro-tetralithium

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL BONDS; CRYSTAL SYMMETRY; CRYSTALLIZATION; ETHERS; IONS; LITHIUM COMPOUNDS; MOLECULAR STRUCTURE;

EID: 0030172865     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270196000546     Document Type: Article
Times cited : (8)

References (11)
  • 8
    • 84875254488 scopus 로고
    • Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1991). SHELXTL-Plus. Release 4.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1991) SHELXTL-Plus
    • Sheldrick, G.M.1
  • 10
    • 0003409324 scopus 로고
    • Siemens Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1994). XSCANS User's Manual. Version 2.1. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1994) XSCANS User's Manual. Version 2.1
  • 11
    • 85033825754 scopus 로고
    • PhD dissertation, University of Wisconsin, Madison, Wisconsin, USA
    • Whipple, W. L. (1991). PhD dissertation, University of Wisconsin, Madison, Wisconsin, USA.
    • (1991)
    • Whipple, W.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.