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Volumn 34, Issue 8, 1996, Pages 1385-1393
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XPS and atomic force microscopy of plasma-treated polysulfone
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL MODIFICATION;
GLOW DISCHARGES;
PLASMAS;
SURFACE TREATMENT;
X RAY PHOTOELECTRON SPECTROSCOPY;
FEED GAS;
NONISOTHERMAL GLOW DISCHARGES;
TOPOGRAPHICAL MODIFICATION;
POLYSULFONES;
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EID: 0030172502
PISSN: 0887624X
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1099-0518(199606)34:8<1385::AID-POLA1>3.0.CO;2-# Document Type: Article |
Times cited : (36)
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References (58)
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