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Volumn 34, Issue 8, 1996, Pages 1385-1393

XPS and atomic force microscopy of plasma-treated polysulfone

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; GLOW DISCHARGES; PLASMAS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030172502     PISSN: 0887624X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-0518(199606)34:8<1385::AID-POLA1>3.0.CO;2-#     Document Type: Article
Times cited : (36)

References (58)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.