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Volumn 7, Issue 2, 1996, Pages 128-133

Nanoscale patterning and selective chemistry of silicon surfaces by ultrahigh-vacuum scanning tunneling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

DESORPTION; NANOTECHNOLOGY; OXIDATION; PASSIVATION; SCANNING TUNNELING MICROSCOPY; SURFACE TREATMENT; SURFACES; VACUUM APPLICATIONS;

EID: 0030172461     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/7/2/006     Document Type: Article
Times cited : (31)

References (22)
  • 11
    • 3643105054 scopus 로고    scopus 로고
    • Virginia Semiconductor, Inc., Fredericksburg, VA 22401, USA
    • Virginia Semiconductor, Inc., Fredericksburg, VA 22401, USA


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.