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Volumn 6, Issue 6, 1996, Pages 797-805

Investigation of the effect of discharge plasma stabilization by a semiconductor

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DEPOSITION; ELECTRODES; METALLIC FILMS; OHMIC CONTACTS; PLASMA INTERACTIONS; PLASMA PROBES; PLASMA SHEATHS; PLASMAS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR PLASMAS;

EID: 0030172353     PISSN: 11554320     EISSN: None     Source Type: Journal    
DOI: 10.1051/jp3:1996155     Document Type: Article
Times cited : (22)

References (11)
  • 1
    • 33751196280 scopus 로고
    • USSR Patents 19460/18-10 and 197820/18-10
    • Paritskii L.G. and Kasymov Sh.S., USSR Patents 19460/18-10 and 197820/18-10 (1973).
    • (1973)
    • Paritskii, L.G.1    Kasymov, Sh.S.2
  • 4
    • 26944479105 scopus 로고
    • Ispolzovanie poluprovodnikov dlya osushestvleniya fotograficheskogo protsessa v dlinnovolnovoi oblasti spektra
    • Paritskii L.G. and Ryvkin S.M., Ispolzovanie poluprovodnikov dlya osushestvleniya fotograficheskogo protsessa v dlinnovolnovoi oblasti spektra, Sov. Phys. Semicond. 4 (1970) 764.
    • (1970) Sov. Phys. Semicond. , vol.4 , pp. 764
    • Paritskii, L.G.1    Ryvkin, S.M.2
  • 7
    • 33751188434 scopus 로고
    • Spektralnye kharakteristiki fotograficheskoi sistemy ionizatsionnogo tipa
    • Lebedeva N.N., Salamov B.G. and Zeinally A.Kh., Spektralnye kharakteristiki fotograficheskoi sistemy ionizatsionnogo tipa, Zhurn. Techn. Fiz. 57 (1987) 1985.
    • (1987) Zhurn. Techn. Fiz. , vol.57 , pp. 1985
    • Lebedeva, N.N.1    Salamov, B.G.2    Zeinally, A.Kh.3
  • 8
    • 33751198650 scopus 로고
    • Visualization of Electrical Inhomogeneities in Semi-insulating Gallium Arsenide
    • Lebedeva N.N., Orbukh V.I. and Zeinally A.Kh., Visualization of Electrical Inhomogeneities in Semi-insulating Gallium Arsenide, Fiz. Tekn. Poluprovodn. 27 (1993) 1134.
    • (1993) Fiz. Tekn. Poluprovodn. , vol.27 , pp. 1134
    • Lebedeva, N.N.1    Orbukh, V.I.2    Zeinally, A.Kh.3
  • 9
  • 10
    • 0028446657 scopus 로고
    • Visualization of Electrical Inhomogeneities in High-ohmic Semiconductor Plates by an Ionization-type Photographic System
    • Lebedeva N.N., Salamov B.G., Akinoglu B.G. and Allakhverdiev K.R., Visualization of Electrical Inhomogeneities in High-ohmic Semiconductor Plates by an Ionization-type Photographic System, J. Phys. D: Appl. Phys. 27 (1994) 1229.
    • (1994) J. Phys. D: Appl. Phys. , vol.27 , pp. 1229
    • Lebedeva, N.N.1    Salamov, B.G.2    Akinoglu, B.G.3    Allakhverdiev, K.R.4
  • 11
    • 33751198430 scopus 로고
    • US Patent 3-743-881
    • Blaszuk P.R., US Patent 3-743-881 (1973).
    • (1973)
    • Blaszuk, P.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.