The oxidation of Cu particles supported on oxidised Si( 100) as studied by nuclear reaction analysis and ellipsometry

Applied Surface Science

Volumn 99, Issue 2, 1996, Pages 127-132

  Van Wijk, R ^a   Gorts P C ^a   Maree C H M ^a   Gijzeman, O L J ^a   Habraken, F H P M ^a   Geus, J W ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

AES; Cu; Ellipsometry; NRA; Oxidation; Particles; RBS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER COMPOUNDS; ELECTRONIC STRUCTURE; ELLIPSOMETRY; OXIDATION; OXYGEN; PARTICLES (PARTICULATE MATTER); PERMITTIVITY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; SINGLE CRYSTALS; STOICHIOMETRY;

COPPER OXIDE; NUCLEAR REACTION ANALYSIS;

COPPER;

EID: 0030172284     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00513-7     Document Type: Article

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