All-optical mass spectrometric system based on picosecond laser pulses

Surface and Interface Analysis

Volumn 24, Issue 6, 1996, Pages 399-404

  Schutze M ^a   Trappe, C ^a   Tabellion, M ^a   Lupke G ^a   Kurz, H ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; DESORPTION; IONIZATION; LASER PULSES; MASS SPECTROMETRY; SEMICONDUCTING GALLIUM ARSENIDE; SPUTTERING; SURFACE PHENOMENA; SURFACE PROPERTIES;

NEUTRAL PARTICLES; OPTICAL MASS SPECTROMETRIC SYSTEM; PICOSECOND LASER PULSES; SPATIAL DISTRIBUTION; SURFACE EXCITATION; SURFACE TEMPERATURE; TEMPORAL DISTRIBUTION;

OPTICAL SYSTEMS;

EID: 0030172229     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199606)24:6<399::AID-SIA134>3.0.CO;2-N     Document Type: Article

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