Analysis of radiation damaged HPGe detectors with a new algorithm

IEEE Transactions on Nuclear Science

Volumn 43, Issue 3 PART 2, 1996, Pages 1570-1575

  Koenen, M ^a   Bruckner J ^a   Fabian, U ^a   Kruse, H ^a   Wanke H ^a   Schroeder, A N F ^b   Starr, R ^f   Evans, L G ^c   Trombka, J I ^c   Drake, D M ^d   Englert, P A J ^e   Dempsey, J ^e  

^a MAX PLANCK INSTITUTE FOR CHEMISTRY   (Germany)

^b UNIVERSITY OF COLOGNE   (Germany)

^c NASA GODDARD SPACE FLIGHT CENTER   (United States)

^d LOS ALAMOS NATIONAL LABORATORY   (United States)

^e SAN JOSE STATE UNIVERSITY   (United States)

^f CATHOLIC UNIVERSITY OF AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRON ENERGY LEVELS; GAMMA RAYS; IRRADIATION; MATHEMATICAL MODELS; PROTONS; RADIATION DAMAGE; SEMICONDUCTING GERMANIUM; SPECTRUM ANALYSIS;

COAXIAL DETECTORS; HIGH PURITY GERMANIUM DETECTORS; HOLE TRAPPING; TAIL BROADENING;

RADIATION DETECTORS;

EID: 0030172061     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.507105     Document Type: Article

References (16)

1. R.H. Pehl, N.W. Madden, J.H. Elliott, T.W. Raudorf, R.C. Trammell, and L.S. Darken, "Radiation Damage Resistance of Reverse Electrode Ge Coaxial Detectors", IEEE Trans. Nucl. Sci., Vol. 26, pp. 321-323, 1979.
2. L.S. Darken Jr., R.C. Trammell, T.W. Raudorf, and R.H. Pehl, "Neutron Damage in Ge(HP) Coaxial Detectors", IEEE Trans. Nucl. Sci., Vol. 28, pp. 572-578, 1981.
3. J. Brückner, M. Körfer, H. Wänke, A.N.F. Schroeder, D. Filges, P. Dragovitsch, P. A. J. Englert, R. Starr , J.I. Trombka, I. Taylor, D. M. Drake, and E.R. Shunk , "Proton-Induced Radiation Damage in Germanium Detectors", IEEE Trans. Nucl. Sci., Vol. 38, No.2, pp. 209-217, 1991.
4. H.W. Kraner, C. Chasman, K.W. Jones, "Effects Produced by Fast Neutron Bombardment of Ge(Li) Gamma Ray Detectors", Nucl. Instr. Meth. Phys. Res., Vol 62, pp. 173-183, 1968.
5. R. Trammell, F.J. Walter, "The Effects of Carrier Trapping in Semiconductor Gamma-Ray Spectrometers", Nucl. Instr. Meth. Phys. Res., Vol. 76, pp. 317-321, 1969.
6. M. Martini, T.A. McMath, "The Effect of Charge Trapping on the Spectrometer Performance of p-i-n Semiconductor Detectors" Nucl. Instr. Meth. Phys. Res., Vol. 86, pp. 245-252, 1970.
7. G.A. Armantrout, H.W. Thompson Jr., "Spectrum Degradation Effects in Ge(Li) Detectors", IEEE Trans. Nucl. Sci., Vol. NS-17, pp. 165-175, 1970.
8. T. Raudorf, R.H. Pehl, "Effect of Charge Carrier Trapping on Germanium Coaxial Detector Line Shapes", Nucl. Instr. Meth. Phys. Res., Vol. A255, pp. 538-551, 1987.
9. N. Fourches, A. Huck, G. Walter, "The Role of Secondary Defects in the Loss of Energy Resolution of Fast-Neutron-Irradiated HPGe Gamma-Ray-Detectors", IEEE Trans. Nucl. Sci., Vol. 38, No.3, pp. 1728-1735, 1991.
10. L.S. Darken, "Role of Disordered Regions in Fast-Neutron Damage of HPGe Detectors", Nucl. Instr. Meth. Phys. Res., Vol. B74, pp. 523, 1993.
11. G.C. Messenger, "A Summary Review of Displacement Damage from High Energy Radiation in Silicon Semiconductors and Semiconductor Devices", IEEE Trans. Nucl. Sci. ,Vol. 39, No.3, pp. 468-473, 1992.
12. M. Koenen, J. Brückner, M. Körfer, I. Taylor, H. Wänke, "Radiation Damage in Large Volume HPGe Detectors by 1.5 GeV Protons", IEEE Trans. Nucl. Sci., Vol. 42, No.4, pp 653-658, 1995.
13. H. Kruse, "Spectra Processing with Computer Graphics", Computers in Activation Analysis and Gamma-Ray Spectroscopy, Proc. Americ. Nucl. Soc. Topical Conf., Mayaguez, Puerto Rico, 1978, pp. 76-84.
14. F. Sauli, CERN 77-09, 1977.
15. J. Llacer, H.W. Kraner, "Neutron Damage and Annealing in High Purity Germanium Radiation Detectors", Nucl. Instr. Meth., Vol. 98, pp. 467-475, 1972.
16. L.S. Darken, R.C. Trammell, T.W. Raudorf, R.H. Pehl, J.H. Elliott, "Mechanism for Fast Neutron Damage of Ge(HP) Detectors", Nucl. Instr. Meth., Vol. 171, pp. 49-59, 1980.