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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 6 SUPPL. B, 1996, Pages 3714-3718

Reversible tip-induced structural modifications in scanning tip microscopy

(2) Cho, Kyeongjae a Joannopoulos, John D a

a MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

Author keywords

Atomic force microscopy; Atomic manipulation; Density functional theory; First principles calculations; Memory storage device; Scanning tunneling microscopy; Si(100) surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; CALCULATIONS; CHEMICAL MODIFICATION; DATA STORAGE EQUIPMENT; GEOMETRY; MOLECULAR DYNAMICS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; TUNGSTEN;

ATOMIC MANIPULATION; DENSITY FUNCTIONAL THEORY; FIRST PRINCIPLE TOTAL ENERGY PSEUDOPOTENTIAL CALCULATION; MICROMECHANICAL HYSTERESIS; REVERSIBLE TIP INDUCED STRUCTURAL MODIFICATIONS; SCANNING TIP MICROSCOPY; TIP SURFACE DISTANCES; TIP SURFACE INTERACTION;

SURFACE STRUCTURE;

EID: 0030171999 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.35.3714 Document Type: Article

Times cited : (7)

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