Single event effect testing of the intel 80386 family and the 80486 microprocessor

IEEE Transactions on Nuclear Science

Volumn 43, Issue 3 PART 1, 1996, Pages 879-885

  Moran, A ^a   Label, K ^a   Gates, M ^a   Seidleck, C ^a   McGraw, R ^a   Broida, M ^a   Firer, J ^a   Sprehn, S ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PERIPHERAL EQUIPMENT; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

INTEL 80386 MICROPROCESSORS; INTEL 80387 COPROCESSORS; INTEL 80486 MICROPROCESSORS; INTEL 82380 PERIPHERAL DEVICES;

MICROPROCESSOR CHIPS;

EID: 0030171991     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.510728     Document Type: Article

References (6)

1. LaBel, K.A. , Stassinopoulos, E.G. , Brucker, G. J. , Staufffer, C. A. , "SEU Tests of a 80386 Based Flight-Computer/Data-Handling System and of Discrete PROM and EEPROM Devices, and SEL Tests of Discrete 80386, 80387, PROM, EEPROM, and ASICs," IEEE Radiation Data Effects Workshop, 1992.
2. Watson, R.K. , Schwartz, H.R. , Nichols, D. K. , "Test Report for Single Event Effects of the 80386DX Microprocessor" NASA/JPL Publication 93-12, February 15, 1993.
3. INTEL Corporation datasheet, 80386DX, September 1993.
4. INTEL Corporation datasheet, 80387, September 1993.
5. INTEL Corporation datasheet, 82380, September 1993.
6. INTEL Corporation datasheet, 80486, February 1995.