Single event damage effects in cryogenic CMOS microelectronics

IEEE Transactions on Nuclear Science

Volumn 43, Issue 3 PART 1, 1996, Pages 912-917

  Pickel, James C ^a  

^a MAXWELL TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC EQUIPMENT; LOW TEMPERATURE EFFECTS; MATHEMATICAL MODELS; MICROELECTRONICS; OPTICAL SENSORS; RADIATION EFFECTS;

CRYOGENIC MICROELECTRONICS; SINGLE EVENT DAMAGE EFFECTS; SPACE BASED OPTICAL SENSORS;

CMOS INTEGRATED CIRCUITS;

EID: 0030171912     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.510733     Document Type: Article

References (7)

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