Improved analog hot-carrier immunity for CMOS mixed-signal applications with LATID technology

IEEE Transactions on Electron Devices

Volumn 43, Issue 6, 1996, Pages 954-957

  Zhao, Ji ^a   Chen, Hung Sheng ^a   Teng, C S ^a   Moberly, Lawrence ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DEGRADATION; ELECTRIC FIELD EFFECTS; ELECTRIC RESISTANCE; ULSI CIRCUITS;

ANALOG PARAMETERS; DRAIN OUTPUT RESISTANCE; LARGE ANGLE TILT IMPLANTED DRAIN; OFFSET VOLTAGE; VOLTAGE GAIN;

HOT CARRIERS;

EID: 0030171904     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.502129     Document Type: Article

References (8)

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