Theoretical study of current and barrier height between aluminum tip and silicon surface in scanning tunneling microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 6 SUPPL. B, 1996, Pages 3710-3713

  Kobayashi, Nobuhiko ^a   Hirose, Kenji ^b   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b NEC CORPORATION   (Japan)

Author keywords

Aluminum; Electronic state under finite field and current; First principles electronic state theory; Recursion transfer matrix method; Scanning tunneling microscopy; Silicon

Indexed keywords

ALUMINUM; CALCULATIONS; CURRENT DENSITY; ELECTRIC FIELDS; ELECTRODES; ELECTRONIC STRUCTURE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACES;

ALUMINUM TIP; ATOMIC SCALE CURRENT DISTRIBUTION; BARRIER HEIGHT; BIELECTRON SYSTEM; FIRST PRINCIPLE ELECTRONIC STATE THEORY; MICROSCOPIC ELECTRONIC STATES; POTENTIAL BARRIER; RECURSION TRANSFER MATRIX METHOD;

ELECTRONIC DENSITY OF STATES;

EID: 0030171818     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.3710     Document Type: Article

References (14)

1. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel: Phys. Rev. Lett. 49 (1982) 57.
2. D. M. Eigler and E. K. Schweizer: Nature 344 (1990) 524.
3. I. W. Lyo and Ph. Avouris: Science 253 (1991) 173.
4. J. Tersoff and D. R. Hamann: Phys. Rev. B 31 (1985) 805.
5. M. Tsukada, K. Kobayashi, N. Isshiki and H. Kageshima: Surf. Sci. Rep. 13 (1991) 265.
6. J. Bardeen: Phys. Rev. Lett. 6 (1961) 57.
7. S. Ciraci, A. Baratoff and I. P. Batra: Phys. Rev. B 42 (1990) 7618.
8. N. D. Lang: Phys. Rev. B 37 (1988) 10395.
9. K. Hirose and M. Tsukada: Phys. Rev. B 51 (1995) 5278.
10. 3/3 = 1/p, where p is the average density.
11. M. Schlüter, J. R. Chelikowsky, S. G. Louie and M. L. Cohen: Phys. Rev. B 12 (1975) 4200.
12. J. R. Chelikowsky, D. J. Chadi and M. L. Cohen: Phys. Rev. B 23 (1981) 4013.
13. D. M. Ceperley and B. J. Alder: Phys. Rev. Lett. 45 (1980) 566.
14. J. Perdew and A. Zunger: Phys. Rev. B 23 (1981) 5048.