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Volumn 43, Issue 3 PART 2, 1996, Pages 1180-1187

Beam test of prototype 18 cm silicon-strip detectors with high speed electronics

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; COLLIDING BEAM ACCELERATORS; COMPUTER SIMULATION; ELECTRON BEAMS; INFRARED RADIATION; LASER APPLICATIONS; LIGHT SOURCES; LINEAR ACCELERATORS; LUMINESCENCE; MICROELECTRONICS; PARTICLE BEAM TRACKING; SILICON SENSORS;

EID: 0030171812     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.506660     Document Type: Article
Times cited : (1)

References (10)
  • 3
    • 33747727932 scopus 로고    scopus 로고
    • The detectors were fabricated by Hamamatsu Photonics Co.
    • The detectors were fabricated by Hamamatsu Photonics Co.
  • 4
    • 0029291812 scopus 로고
    • Study of 18 cm Long Single-Sided AC-coupled Silicon Microstrip Detectors
    • April
    • R.T. Kollipara, et al., "Study of 18 cm Long Single-Sided AC-coupled Silicon Microstrip Detectors," IEEE Trans. Nucl. Sci., vol. 42, pp 92-101, April 1995.
    • (1995) IEEE Trans. Nucl. Sci. , vol.42 , pp. 92-101
    • Kollipara, R.T.1
  • 5
    • 0027649209 scopus 로고
    • A Fast Shaping Amplifier-Comparator Integrated Circuit for Silicon Strip Detectors
    • Aug.
    • E. Barberis, et al., "A Fast Shaping Amplifier-Comparator Integrated Circuit for Silicon Strip Detectors," IEEE Trans. Nucl. Sci., vol. 40, pp 740-743, Aug. 1993.
    • (1993) IEEE Trans. Nucl. Sci. , vol.40
    • Barberis, E.1
  • 6
    • 33747630174 scopus 로고    scopus 로고
    • REL-LABS Inc. 30 Midland Ave, Hicksville, NY 11801
    • REL-LABS Inc. 30 Midland Ave, Hicksville, NY 11801.
  • 7
    • 0001129520 scopus 로고
    • Low-Noise Techniques in Detectors
    • V. Radeka, "Low-Noise Techniques in Detectors," Ann. Rev. Nucl. Part. Sci., vol. 38, pp 217-277, 1988.
    • (1988) Ann. Rev. Nucl. Part. Sci. , vol.38 , pp. 217-277
    • Radeka, V.1
  • 9
    • 84939730902 scopus 로고
    • Mathematical Analysis of Random Noise
    • July
    • S.O. Rice, "Mathematical Analysis of Random Noise," Bell Systems Technical Journal, vol. 23, pp 282-333, July 1944,
    • (1944) Bell Systems Technical Journal , vol.23 , pp. 282-333
    • Rice, S.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.