Nonscalability of alpha-particle-induced charge collection area

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 35, Issue 6 A, 1996, Pages

  Tanii, T ^a   Matsukawa, T ^a   Mori, Sh ^a   Koh, M ^a   Shigeta, B ^a   Igarashi, K ^a   Ohdomari, I ^a  

^a WASEDA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER DEVICES; DATA STORAGE EQUIPMENT; DYNAMICS; ERROR ANALYSIS; RANDOM PROCESSES; WAVEGUIDE JUNCTIONS;

CHARGE COLLECTION; SCALE DOWN; SINGLE-ION MICROPROBE; SOFT ERROR;

ALPHA PARTICLES;

EID: 0030171612     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.l688     Document Type: Article

References (7)