메뉴 건너뛰기




Volumn 79, Issue 6, 1996, Pages 1453-1456

Dielectric dispersion of polycrystalline aluminum nitride at microwave frequencies

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES OF SOLIDS; DIELECTRIC RELAXATION; ELASTICITY; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; MICROWAVES; NATURAL FREQUENCIES; PERMITTIVITY MEASUREMENT; PIEZOELECTRICITY; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; SINTERING;

EID: 0030170497     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb08749.x     Document Type: Article
Times cited : (18)

References (14)
  • 1
    • 0347283794 scopus 로고
    • The Dielectric Properties of Aluminum Nitride Substrates for Microelectronics Packaging
    • J S Thorp, D. Evans, M. Al-Naief, and M. Akhtaruzzaman, "The Dielectric Properties of Aluminum Nitride Substrates for Microelectronics Packaging," J. Mater. Sci., 25 [12] 4965-71 (1990).
    • (1990) J. Mater. Sci. , vol.25 , Issue.12 , pp. 4965-4971
    • Thorp, J.S.1    Evans, D.2    Al-Naief, M.3    Akhtaruzzaman, M.4
  • 2
    • 0025435791 scopus 로고
    • Wideband Characterization of Aluminum Nitride (AlN) Substrates and High-Frequency Application on These Substrate
    • Farzanehfard and A. Elshabini-Riad, "Wideband Characterization of Aluminum Nitride (AlN) Substrates and High-Frequency Application on These Substrate," Conference on Precision Electromagnetic Measurements, 218-19 (1990).
    • (1990) Conference on Precision Electromagnetic Measurements , pp. 218-219
    • Farzanehfard1    Elshabini-Riad, A.2
  • 3
    • 4243157170 scopus 로고
    • Broadband Dielectric Characterization of Aluminum Nitride
    • G. Angenieux, "Broadband Dielectric Characterization of Aluminum Nitride," Microwave J., 33 [10] 91-92, 95-96, 98 (1990).
    • (1990) Microwave J. , vol.33 , Issue.10 , pp. 91-92
    • Angenieux, G.1
  • 4
    • 4243141475 scopus 로고
    • High-Frequency Dielectric and Loss Tangent Properties of Aluminum Nitride over Temperature Range
    • H. Sadri, "High-Frequency Dielectric and Loss Tangent Properties of Aluminum Nitride over Temperature Range," Proc. Int. Symp. Microelectron., 503-506 (1990).
    • (1990) Proc. Int. Symp. Microelectron. , pp. 503-506
    • Sadri, H.1
  • 5
    • 0025446719 scopus 로고
    • Dielectric Behavior of Hot-Pressed AlN Ceramic Exposed to Inorganic Acid Vapors
    • K. K. Srivastaba, M. Zulfequar, and A. Kumar, "Dielectric Behavior of Hot-Pressed AlN Ceramic Exposed to Inorganic Acid Vapors," J. Mater. Sci., 25 [6] 2861-65 (1990).
    • (1990) J. Mater. Sci. , vol.25 , Issue.6 , pp. 2861-2865
    • Srivastaba, K.K.1    Zulfequar, M.2    Kumar, A.3
  • 6
    • 0028408731 scopus 로고
    • An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1 GHz
    • A. Nakayama and K. Shimizu, "An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1 GHz," IEICE Trans. Electron., E77-C [4] 633-38 (1994).
    • (1994) IEICE Trans. Electron. , vol.E77-C , Issue.4 , pp. 633-638
    • Nakayama, A.1    Shimizu, K.2
  • 7
    • 0028448778 scopus 로고
    • A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectic Material
    • A. Nakayama, "A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectic Material," IEICE Trans. Electron., E77-C [6] 894-99 (1994).
    • (1994) IEICE Trans. Electron. , vol.E77-C , Issue.6 , pp. 894-899
    • Nakayama, A.1
  • 10
    • 0000706563 scopus 로고
    • CIX. Theory of Barium Titanate - Part II
    • A. F. Devonshire, "CIX. Theory of Barium Titanate - Part II," Philos. Mag., 42, 1065-79 (1951).
    • (1951) Philos. Mag. , vol.42 , pp. 1065-1079
    • Devonshire, A.F.1
  • 11
    • 0024027992 scopus 로고
    • Improved Cavity Resonance Method for Nondestructive Measurement of Complex Permittivity of Dielectric Plate
    • Y. Kobayashi and J. Sato, "Improved Cavity Resonance Method for Nondestructive Measurement of Complex Permittivity of Dielectric Plate," CPEM Dig., 147-48 (1988).
    • (1988) CPEM Dig. , pp. 147-148
    • Kobayashi, Y.1    Sato, J.2
  • 12
    • 0009873112 scopus 로고
    • Complex Permittivity Measurement of Dielectric Plate by a Cavity Resonance Method
    • MW88-40
    • Y. Kobayashi and J. Sato, "Complex Permittivity Measurement of Dielectric Plate by a Cavity Resonance Method," IEICE Tech. Rept., MW88-40, pp. 43-50, 1988.
    • (1988) IEICE Tech. Rept. , pp. 43-50
    • Kobayashi, Y.1    Sato, J.2
  • 14
    • 0003116688 scopus 로고
    • Basic Study on the Oscillation of a Homogeneous Elastic Sphere
    • Y. Sato and T. Usami, "Basic Study on the Oscillation of a Homogeneous Elastic Sphere," Geophys. Mag., 31, 15-24 (1962).
    • (1962) Geophys. Mag. , vol.31 , pp. 15-24
    • Sato, Y.1    Usami, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.