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Volumn 98, Issue 9, 1996, Pages 835-838

Optically detected electron paramagnetic resonance of the shallow aluminium acceptor in 4H-and 6H-silicon carbide

Author keywords

A. semiconductors; C. impurities in semiconductors; E. electron paramagnetic resonance

Indexed keywords

ABSORPTION SPECTROSCOPY; ALUMINUM; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; MAGNETIC FIELDS; PHOTOLUMINESCENCE; SEMICONDUCTOR DOPING; SILICON CARBIDE;

EID: 0030170470     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)80017-2     Document Type: Article
Times cited : (8)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.