Convergent-beam electron diffraction study of structure of β-silicon nitride3

Physica Status Solidi (A) Applied Research

Volumn 155, Issue 2, 1996, Pages 289-297

  Wang, Qinglin ^a   Yan, Yanfa ^a   Wang, Renhui ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); KINEMATICS; PHOTOGRAPHY;

CONVERGENT BEAM ELECTRON DIFFRACTION; HIGHER ORDER LAUE ZONE LINE PATTERNS; KINEMATIC APPROXIMATION;

SILICON NITRIDE;

EID: 0030170428     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.2211550202     Document Type: Article

References (11)

1. R. MARCHAND, Y. LAURENT, J. LANG, and M. T. LE BIHAN, Acta cryst B25, 2157 (1969).
2. K. KATO, Z. INOUE, K. KIJIMAJA, I. KAWADA, H. TANAKA, and T. YAMANE, J. Amer. Ceram. Soc. 58, 90 (1975).
3. T. EKSTRÖM and M. NYGREN, J. Amer. Ceram. Soc. 75, 259 (1992).
4. O. BORGEN and H. M. SEIP, Acta chem. Scand. 15, 1789 (1961).
5. W. B. PEARSON, Structure Rep. No. 26, N. V. A. Oosthoek's Uitgevers Mij, Utrecht 1961 (p. 292).
6. T. HAHN, International Tables for Crystallography, Vol. A, D. Reidel Publ. Co., Dordrecht 1983 (p. 554).
7. R. GRÜN, Acta cryst. B35, 800 (1979).
8. M. X. DAI, HUAMIN ZOU, RENHUI WANG, YANFA YAN, and JIN PAN, phys. stat. sol. (a) 142, K79 (1994).
9. Y. YAN, R. WANG, H. ZOU, M. DAI, L. FROYEN, and L. DELAEY, Scripta Metall et Mater. 30, 885 (1994).
10. R. WANG, H. Zou, and S. JIAO, Proc. 11th Internat. Congr. Electron Microscopy, Vol. I, Ed. T. IMURA, S. MARUSE, and T. SUZUKI, Japanese Soc. Electron Microscopy, Kyoto 1986 (p. 711).
11. P. M. JONES, G. M. RACKHAM, and J. W. STEEDS, Proc. Roy. Soc. A 354, 197 (1977).