Electromigration behavior under a unidirectional time-dependent stress

IEEE Transactions on Electron Devices

Volumn 43, Issue 6, 1996, Pages 877-882

  Dwyer, Vincent M ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY VALUE PROBLEMS; COMPUTER SIMULATION; ELECTRIC CURRENTS; FINITE DIFFERENCE METHOD; INDUCED CURRENTS; INTEGRAL EQUATIONS; NUMERICAL METHODS; PARTIAL DIFFERENTIAL EQUATIONS; VLSI CIRCUITS;

COUPLED INTEGRAL EQUATIONS; DRIFT DIFFUSION MODEL; SEMI EMPIRICAL METHODS; STANDARD ASYMPTOTIC TECHNIQUES; TWO DIMENSIONAL PROCESS;

ELECTROMIGRATION;

EID: 0030170228     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.502118     Document Type: Article

References (22)

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