Behavior of insoluble materials in artificial contamination tests

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 3, Issue 3, 1996, Pages 432-438

  Ishii, Masaru ^a   Komatsubara, Minoru ^b   Matsuoka, Ryosuke ^c   Matsumoto, Takaie ^d   Kurokawa, Masaaki ^d   Naito, Katsuhiko ^e  

^a UNIVERSITY OF TOKYO   (Japan)

^b Okayama Shoka University   (Japan)

^c NGK INSULATORS LTD   (Japan)

^d SHIZUOKA UNIVERSITY   (Japan)

^e NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC INSULATING MATERIALS; ELECTRIC LINES; FLASHOVER; FOG;

ARTIFICIAL CONTAMINATION TESTS; CLEAN FOG TESTS; INSOLUBLE MATERIALS;

ELECTRIC INSULATORS;

EID: 0030169676     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.506217     Document Type: Article

References (9)

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2. Artificial Pollution Tests on HV Insulators to be used on dc Systems, Technical Report, IEC 1245, Oct. 1993.
3. P. J. Lambeth, "Variable-voltage Application for Insulator Pollution Tests", IEEE Transactions on Power Delivery, Vol. 3, pp. 2103-2111, 1988.
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9. R. Matsuoka, K. Kondo, K. Naito, and M. Ishii, "Influence of Non-soluble Contaminants on the Flashover Voltages of Artificially Contaminated Insulators", IEEE Trans. on Power Delivery, Vol. 11, pp. 420-430, 1996.