Chemical-specific imaging of multicomponent metal surfaces on the nanometer scale by scanning tunneling spectroscopy

Applied Physics A: Materials Science and Processing

Volumn 62, Issue 6, 1996, Pages 571-573

  Bode, M ^a   Pascal, R ^a   Wiesendanger, R ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; FERMI LEVEL; FILMS; IMAGING TECHNIQUES; IRON; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; SUBSTRATES; TUNGSTEN;

CHEMICAL SPECIFIC IMAGING; DIFFERENTIAL TUNNELING CONDUCTIVITY; LOCAL TUNNELING SPECTRA; NANOMETER SCALE; SCANNING TUNNELING SPECTROSCOPY; SUBMONOLAYER FILM; TOPOGRAPHY;

SURFACE STRUCTURE;

EID: 0030169613     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050343     Document Type: Article

References (8)