Ion-induced effects on ion-driven deuterium permeation through niobium membrane

Vacuum

Volumn 47, Issue 6-8, 1996, Pages 947-950

  Bandourko, V ^a   Ohkoshi, K ^a   Yamaguchi, K ^a   Yamawaki, M ^a   Koborov, N ^b   Kurnaev, V ^b   Levchuk, D ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b NATIONAL RESEARCH NUCLEAR UNIVERSITY MEPHI   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; AUGER ELECTRON SPECTROSCOPY; COMPOSITION; DESORPTION; ION BOMBARDMENT; ION IMPLANTATION; MEMBRANES; NIOBIUM; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; SURFACE STRUCTURE; SURFACES;

IN SITU SURFACE ANALYSIS; ION DRIVEN DEUTERIUM PERMEATION; ION INDUCED DESORPTION; ION INDUCED EFFECTS; NIOBIUM MEMBRANE; STEADY STATE PERMEATION RATE; SURFACE CHEMICAL COMPOSITION; SURFACE IMPERFECTION SITES;

DEUTERIUM;

EID: 0030169412     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0042-207x(96)00099-1     Document Type: Article

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