Charge density study with the Maximum Entropy Method on model data of silicon. A search for non-nuclear attractors

Canadian Journal of Chemistry

Volumn 74, Issue 6, 1996, Pages 1054-1058

  De Vries, R Y ^a   Briels, W J ^a   Feil, D ^a   Te Velde, G ^b   Baerends, E J ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

Charge density; Maximum Entropy Method; Non nuclear attractors; X ray diffraction

Indexed keywords

ATOMS; CHEMICAL BONDS; ELECTRONIC STRUCTURE; FOURIER TRANSFORMS; PROBABILITY DENSITY FUNCTION; SILICON; X RAY DIFFRACTION;

CHARGE DENSITY; ELECTRON DENSITY DISTRIBUTION; MAXIMUM ENTROPY METHOD; NON NUCLEAR ATTRACTORS; SILICON ATOMS;

CARRIER CONCENTRATION;

EID: 0030169270     PISSN: 00084042     EISSN: None     Source Type: Journal    
DOI: 10.1139/v96-118     Document Type: Article

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