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Volumn 8, Issue 6, 1996, Pages 806-808

Investigation of optical losses in photoelastic and ridge waveguides in GaAs-AlGaAs heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

DRY ETCHING; ELECTRIC LOSSES; HETEROJUNCTIONS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NICKEL COMPOUNDS; PHOTOLITHOGRAPHY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SUBSTRATES; TUNGSTEN COMPOUNDS;

EID: 0030169242     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.502101     Document Type: Article
Times cited : (10)

References (12)
  • 1
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    • Yamamoto, Y.1    Kamiya, T.2    Yanai, H.3
  • 3
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    • Photoelastic waveguides and the controlled introduction of strain in III-V semiconductors by means of thin film technology
    • Q. Z. Liu, F. Deng, L. S. Yu, Z. F. Guan, S. A. Pappert, P. K. L. Yu, S. S. Lau, J. M. Redwing, and T. F. Kuech, "Photoelastic waveguides and the controlled introduction of strain in III-V semiconductors by means of thin film technology," J. Appl Phys., vol. 78, pp. 236-244, 1995.
    • (1995) J. Appl Phys. , vol.78 , pp. 236-244
    • Liu, Q.Z.1    Deng, F.2    Yu, L.S.3    Guan, Z.F.4    Pappert, S.A.5    Yu, P.K.L.6    Lau, S.S.7    Redwing, J.M.8    Kuech, T.F.9
  • 4
    • 0024142352 scopus 로고
    • Compound semiconductor contact metallurgy
    • T. Sands, "Compound semiconductor contact metallurgy," Mater. Sci. Eng., vol. B1, pp. 289-312, 1988.
    • (1988) Mater. Sci. Eng. , vol.B1 , pp. 289-312
    • Sands, T.1
  • 5
    • 0016903555 scopus 로고
    • Internal stresses in titanium, nickel, molybdenum, and tantalum films deposited by cylindrical magnetron sputtering
    • J. A. Thornton, and D. W. Hoffman, "Internal stresses in titanium, nickel, molybdenum, and tantalum films deposited by cylindrical magnetron sputtering," J. Vac. Sci. Technol., vol. 14, pp. 164-168, 1977.
    • (1977) J. Vac. Sci. Technol. , vol.14 , pp. 164-168
    • Thornton, J.A.1    Hoffman, D.W.2
  • 7
    • 0022075408 scopus 로고
    • Simple and accurate loss measurement technique for semiconductor optical waveguides
    • R. G. Walker, "Simple and accurate loss measurement technique for semiconductor optical waveguides," Electron. Lett., vol. 21, 581-583 (1985).
    • (1985) Electron. Lett. , vol.21 , pp. 581-583
    • Walker, R.G.1
  • 8
    • 4243071748 scopus 로고
    • T. Tamir, Ed. (Springer Series in Optical Sciences), New York: Springer-Verlag, ch. 2 and 5
    • R. G. Hunsperger, in Integrated Optics: Theory and Technology, 3rd ed., T. Tamir, Ed. (Springer Series in Optical Sciences), vol. 33. New York: Springer-Verlag, 1991, ch. 2 and 5.
    • (1991) Integrated Optics: Theory and Technology, 3rd Ed. , vol.33
    • Hunsperger, R.G.1
  • 10
    • 3943079397 scopus 로고
    • Low-loss single-mode GaAs/AlGaAs optical waveguides grown by organometallic vapor phase epitaxy
    • E. Kapon, and R. Bhat, "Low-loss single-mode GaAs/AlGaAs optical waveguides grown by organometallic vapor phase epitaxy," Appl. Phys. Lett., vol. 50, pp. 1628-1630, 1987.
    • (1987) Appl. Phys. Lett. , vol.50 , pp. 1628-1630
    • Kapon, E.1    Bhat, R.2
  • 11
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    • Low-loss AlGaAs optical rectangular waveguides at 830 nm
    • M. K. Hibbs-Brenner and C. T. Sullivan, "Low-loss AlGaAs optical rectangular waveguides at 830 nm," Appl. Phys. Lett., vol. 56, pp. 1529-1531, 1990.
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    • Hibbs-Brenner, M.K.1    Sullivan, C.T.2
  • 12
    • 0027109191 scopus 로고
    • Measurement of surface roughness in buried channel waveguides
    • F. Ladouceur, J. D. Love and T. J. Senden, "Measurement of surface roughness in buried channel waveguides," Electron. Lett., vol. 28, pp. 1321-1322, 1992.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.