Transport properties of Tl2Ba2CaCu2O8 weak links on LaAlO3 bicrystal substrates

Journal of Applied Physics

Volumn 79, Issue 12, 1996, Pages 9221-9223

  Chen, Y F ^a,c   Ivanov, Z G ^a   Stepantsov, E A ^a,d   Tzalenchuk, A Ya ^a,d   Zarembinski, S ^a,e   Claeson, T ^a   Johansson, L G ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b UNIVERSITY OF GOTHENBURG   (Sweden)

^c INSTITUTE OF PHYSICS   (China)

^d SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^e INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; GRAIN BOUNDARIES; JOSEPHSON JUNCTION DEVICES; LANTHANUM COMPOUNDS; MICROWAVES; NATURAL FREQUENCIES; SIGNAL NOISE MEASUREMENT; SQUIDS; TRANSPORT PROPERTIES; WHITE NOISE;

CRITICAL TEMPERATURE; FLUX NOISE SPECTRA; LANTHANUM ALUMINATE; RESISTIVELY SHUNTED JUNCTION MODEL; THALLIUM BARIUM CALCIUM COPPER OXIDE;

THALLIUM COMPOUNDS;

EID: 0030169198     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362595     Document Type: Article

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