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Volumn 80, Issue 2, 1996, Pages 105-110

Probing electronic state charging in organic electronic devices using electroabsorption spectroscopy

Author keywords

Devices; Electronic state charging; Spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRIC CONTACTS; ELECTRIC SPACE CHARGE; ELECTRIC VARIABLES MEASUREMENT; ELECTRON ABSORPTION; ELECTRON ENERGY LEVELS; ELECTROSTATICS; INTERFACES (MATERIALS); ORGANIC COMPOUNDS; ORGANIC CONDUCTORS; PROBES; SPECTRUM ANALYSIS;

EID: 0030169148     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(96)03689-2     Document Type: Article
Times cited : (18)

References (32)
  • 3
    • 26744435368 scopus 로고
    • W.P. Su, J.R. Schrieffer and A.J. Heeger, Phys. Rev. Lett., 42 (1979) 1698; 22 (1980) 2209.
    • (1980) Phys. Rev. Lett. , vol.22 , pp. 2209


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.