메뉴 건너뛰기




Volumn 9, Issue 3, 1996, Pages 51-55

Bringing antimonides up to potential

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR GROWTH; SUBSTRATES;

EID: 0030168539     PISSN: 09611290     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0961-1290(96)80128-1     Document Type: Article
Times cited : (2)

References (4)
  • 1
    • 0003075549 scopus 로고
    • Growth Properties of GaSb: The Structure of the Residual Acceptor Centres
    • Y.J. van der Meulen Growth Properties of GaSb: The Structure of the Residual Acceptor Centres J. Phys. Chem. Solids 28 1967 25 32
    • (1967) J. Phys. Chem. Solids , vol.28 , pp. 25-32
    • van der Meulen, Y.J.1
  • 2
    • 0013049193 scopus 로고
    • Czochralski Growth and Characterization of GaSb
    • W.A. Sunder Czochralski Growth and Characterization of GaSb 78 J. Crystal Growth 1980 9 18 1980
    • (1980) J. Crystal Growth , pp. 9-18
    • Sunder, W.A.1
  • 3
    • 0019578094 scopus 로고
    • Electrical and Optical Properties of Gallium Antimonide
    • K. Nakashima Electrical and Optical Properties of Gallium Antimonide Jap. J. Applied Phys. 20 2 1981 1085 1094
    • (1981) Jap. J. Applied Phys. , vol.20 , Issue.2 , pp. 1085-1094
    • Nakashima, K.1
  • 4
    • 0019032752 scopus 로고
    • A Model for the Determination of the Defect Concentrations in III–V Compounds
    • G. Edelin D. Mathiot A Model for the Determination of the Defect Concentrations in III–V Compounds Phil. Mag “B” 42 1980 95 110
    • (1980) Phil. Mag “B” , vol.42 , pp. 95-110
    • Edelin, G.1    Mathiot, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.