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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 6 SUPPL. B, 1996, Pages 3695-3699

Element-specific contrast in scanning tunneling microscopy via resonant tunneling

(4) Himpsel, Franz J a Jung, Thomas b Schlittler, Reto b Gimzewski, Jim K b

a Wisconsin Electric Machines and Power Electronics Consortium (United States)

b IBM RESEARCH ZURICH (Switzerland)

Author keywords

Growth; Image states; Inverse photoemission; Microprobe; Nanostructures; Steps; STM; Surfaces

Indexed keywords

CHARACTERIZATION; CRYSTAL GROWTH; IMAGING TECHNIQUES; METALS; MOLYBDENUM; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PHOTOEMISSION; SURFACES; TUNGSTEN;

ELEMENT SPECIFIC CONTRAST; ELEMENTAL IDENTIFICATION; IMAGE STATES; INVERSE PHOTOEMISSION; MICROPROBE; RESONANT TUNNELING; SPATIAL RESOLUTION; SURFACE STATES; WORK FUNCTION;

SCANNING TUNNELING MICROSCOPY;

EID: 0030167953 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.35.3695 Document Type: Article

Times cited : (2)

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