X-ray photoelectron spectroscopy of Zn1-xCdxSe thin films

Journal of Electron Spectroscopy and Related Phenomena

Volumn 81, Issue 1, 1996, Pages 69-77

  Islam, R ^a,b   Rao, D R ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b INDIAN SPACE RESEARCH ORGANISATION   (India)

Author keywords

Auger parameter; Electron beam; Thin film; XPS; Zn1 xCdxSe

Indexed keywords

ARGON; BINDING ENERGY; COMPOSITION; DEPOSITION; ELECTRON BEAMS; GLASS; ION BOMBARDMENT; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; SUBSTRATES; THIN FILMS;

AUGER PARAMETER; CORE LEVEL BINDING ENERGY; ELECTRON BEAM DEPOSITION; IONICITY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030167935     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(95)02551-0     Document Type: Article

References (29)

1. J. Ren, K.A. Bowers, B. Sneed, D.L. Dreifus, J.W. Cook, Jr., J.F. Schetzina and R.M. Kolbas, Appl. Phys. Lett., 57 (1990) 1901.
2. MA. Haase, J. Qiu, J.M. DePuydt and H. Cheng, Appl. Phys. Lett., 59 (1991) 1272.
3. A. Burger, M. Roth and M. Schieber, IEEE Trans., NS-32 (1985) 556.
4. A.L. Dawar, P.K. Shishodia and P.C. Mathur, J. Mater. Sci. Lett., 8 (1989) 561.
5. K. Hingerl, H. Sitter, D.J. As and W. Rothemund, J. Crystal Growth, 101 (1990) 180.
6. X.W. Fan, Z.K. Tang and H. Tian, J. Crystal Growth, 101 (1990) 944.
7. D.R. Rao and R. Islam, Thin Solid Films, 224 (1993) 191.
8. R. Islam and D.R, Rao, Solid State Commun., in press.
9. R. Islam and D.R. Rao, J. Mater. Sci. Lett., 13 (1994) 1637.
10. R. Islam, Ph.D Dissertation, Indian Institute of Technology, Kharagpur (1994).
11. D.A. Shirley, Phys. Rev. B, 5 (1972) 4709.
12. C.D. Wagner, Disc. Faraday Soc., 80 (1975) 291.
13. C.D. Wagner, J. Electron Spectrosc. Relat. Phenom., 10 (1977) 3105.
14. C.D. Wagner, L.H. Gale and R.H. Raymond, Anal. Chem., 51 (1979) 466.
15. T.F. McGee, III and H.J. Cornelissen, Appl. Surf. Sci., 35 (1988) 371.
16. Y.-D. Kim, S.L. Cooper, M.V. Klien and B.J. Jonker, Appl. Phys. Lett., 62 (1993) 2387.
17. V. Krishnan, D. Ham, K.K. Mishra and K. Rajeshwar, J. Electrochem. Soc., 139 (1992) 23.
18. F. Rault, B. Fortin and Y. Colin, Thin Solid Films, 182 (1989) 1.
19. N.J. Shevchik, J. Tejeda and M. Cardona, Phys. Rev. B, 9 (1974) 2627.
20. C. Falter, W. Ludwig and M. Selmke, Solid State Commun., 54 (1985) 321.
21. A. Goldmann, J. Tejeda, N.J. Shevchik and M. Cardona, Phys. Rev. B, 10 (1974) 4388.
22. J.C. Phillips, Rev. Modern Phys., 42 (1970) 317.
23. J.C. Phillips, Bond and Bands in Semiconductors, Academic Press, New York, 1973, p. 42.
24. D. Briggs and M.P. Seah (Eds.), Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Wiley, New York, 1983, p. 511.
25. R. Behrish, Sputtering by Particle Bombardment, Vol. 2, Springer, Heidelberg, 1983.
26. R. Shimizu, Nucl. Instrum. Methods, B18 (1987) 486.
27. J.B. Malhebe, Crit. Rev. Solid State Mater. Sci., 19 (1994) 129.
28. A. Ebina, K. Asano and T. Takahashi, Phy. Rev. B, 22 (1980) 1980.
29. L.J. Brillson, Surf. Sci., 69 (1977) 62.