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Volumn 113, Issue 1-4, 1996, Pages 205-208

Low energy ion beam irradiation of silicon

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; GOLD; ION BEAMS; ION BOMBARDMENT; ION SOURCES; LASER BEAM EFFECTS; LIGHT REFLECTION; LIQUID METALS; OPTICAL VARIABLES MEASUREMENT; SINGLE CRYSTALS;

EID: 0030166762     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01366-0     Document Type: Article
Times cited : (7)

References (13)
  • 9
    • 0040174761 scopus 로고
    • ed. S. Coffa, G. Ferla, F. Briolo and E. Rimini Elsevier, Amsterdam
    • M. Wagner, S. Käpplinger and H.D. Geiler, in: Ion Impl. Technol. 94, ed. S. Coffa, G. Ferla, F. Briolo and E. Rimini (Elsevier, Amsterdam, 1995) p. 634.
    • (1995) Ion Impl. Technol. , vol.94 , pp. 634
    • Wagner, M.1    Käpplinger, S.2    Geiler, H.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.