Benchmarking the Compton coincidence technique for measuring electron response non-proportionality in inorganic scintillators

IEEE Transactions on Nuclear Science

Volumn 43, Issue 3 PART 2, 1996, Pages 1271-1276

  Rooney, Brian D ^a   Valentine, John D ^a  

^a University of Cincinnati   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; GAMMA RAYS; INORGANIC COMPOUNDS; LIGHT; LIGHT MEASUREMENT; OPTICAL VARIABLES MEASUREMENT; SURFACES; X RAYS;

COMPTON COINCIDENCE TECHNIQUE; COMPTON SCATTERING; ELECTRON RESPONSE MEASUREMENT; INORGANIC SCINTILLATORS; MONO ENERGETIC SCINTILLATOR RESPONSE; SURFACE INTERACTIONS; X RAY ESCAPE;

PHOSPHORS;

EID: 0030166377     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.506676     Document Type: Article

References (11)

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