Microwave properties of YBCO thin films on YSZ substrates in the coupled grain model approach

Physica C: Superconductivity and its Applications

Volumn 264, Issue 3-4, 1996, Pages 195-203

  Nurgaliev, T ^a   Chakalov, R A ^a   Donchev, T ^a   Ivanov, Z ^a   Spasov, A ^a  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; ELECTRONIC PROPERTIES; GRAIN BOUNDARIES; MAGNETRON SPUTTERING; MATHEMATICAL MODELS; MICROWAVE DEVICES; NATURAL FREQUENCIES; OXIDE SUPERCONDUCTORS; RESONATORS; SUPERCONDUCTIVITY;

COUPLED GRAIN MODEL; FILM RESISTIVITY; MICRODEFECTS; MICROSTRIP RESONATORS; PHENOMENOLOGICAL LOSS EQUIVALENCE METHOD; SUPERCONDUCTING PENETRATION DEPTH; SURFACE RESISTANCE; TWO FLUID MODEL;

SUPERCONDUCTING FILMS;

EID: 0030166240     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(95)00673-7     Document Type: Article

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