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Volumn 356, Issue 1-3, 1996, Pages 68-74
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Activated chemisorption of oxygen on Si(111)-2 x 1
a a a a,c a b |
Author keywords
Adsorption kinetics; Atom solid reactions; Chemisorption; Infrared absorption spectroscopy; Physical adsorption; Semiconducting surfaces; Silicon; Single crystal surfaces; Solid gas interfaces; Sticking
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Indexed keywords
ABSORPTION SPECTROSCOPY;
ACTIVATION ENERGY;
ADSORPTION;
DESORPTION;
INFRARED SPECTROSCOPY;
INTERFACES (MATERIALS);
MATHEMATICAL MODELS;
OXYGEN;
REACTION KINETICS;
SEMICONDUCTING SILICON;
SINGLE CRYSTALS;
SURFACES;
ATOM SOLID REACTIONS;
CLASSICAL LANGMUIR THEORY;
INFRARED ABSORPTION SPECTROSCOPY;
SEMICONDUCTING SURFACES;
STICKING COEFFICIENT;
CHEMISORPTION;
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EID: 0030165786
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)00013-1 Document Type: Article |
Times cited : (10)
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References (35)
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