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Volumn 357-358, Issue , 1996, Pages 28-31
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Adsorption reactions of Ti/Si(001) by variable-temperature STM
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Author keywords
Atom solid interactions; Atom solid reactions; Diffusion and migration; Growth; Scanning tunneling microscopy; Silicon; Surface diffusion; Titanium
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Indexed keywords
CHEMICAL BONDS;
DIFFUSION IN SOLIDS;
GROWTH (MATERIALS);
SCANNING TUNNELING MICROSCOPY;
SILICON;
SURFACE MEASUREMENT;
SURFACE PHENOMENA;
SURFACE TREATMENT;
TITANIUM;
ATOM SOLID INTERACTIONS;
ATOM SOLID REACTION;
DIMER RECONSTRUCTION;
MONATOMIC ADSORPTION;
SITE CONVERSION;
SURFACE DIFFUSION;
VACANCY SITE ADSORPTION;
VARIABLE TEMPERATURE SCANNING TUNNELING SPECTROSCOPY;
ADSORPTION;
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EID: 0030165437
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)00051-9 Document Type: Article |
Times cited : (8)
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References (8)
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