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Volumn 98, Issue 10, 1996, Pages 913-916

Site-sensitive yield of atomic emission induced by laser irradiation on Si(111)-7×7 surface

Author keywords

A. semiconductors; A. surfaces and interfaces; B. laser processing; C. scanning tunneling microscopy

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRON EMISSION; IRRADIATION; LASER PULSES; MELTING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON;

EID: 0030165191     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)80018-4     Document Type: Article
Times cited : (21)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.