Two-dimensional measurements of thin film erosion and deposition by colorimetry of interference colors and its application in fusion devices

Vacuum

Volumn 47, Issue 6-8, 1996, Pages 919-923

  Wienhold, P ^a   Weschenfelder, F ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

a B:D; Colorimetry; Erosion deposition modelling; Protective coatings; TEXTOR 94; Thin film erosion

Indexed keywords

COLOR; COLORIMETRY; COMPUTER SIMULATION; CRYSTAL IMPURITIES; DEPOSITION; GRAPHITE; LIGHT INTERFERENCE; PLASMAS; PROTECTIVE COATINGS; SURFACE TREATMENT; THIN FILMS;

EROSION RATE; FILM THICKNESS; FUSION DEVICES; HYDROGEN FLUX; INTERFERENCE COLORS; THIN FILM EROSION; TWO DIMENSIONAL MEASUREMENTS;

TOKAMAK DEVICES;

EID: 0030164875     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0042-207x(96)00094-2     Document Type: Article

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