Applications of simulated x-ray spectra to x-ray imaging

Journal of Physics D: Applied Physics

Volumn 29, Issue 6, 1996, Pages 1613-1618

  Elhila, H ^a   Mouze, D ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CAMERAS; CHARGE COUPLED DEVICES; COMPUTER SIMULATION; ERRORS; IMAGE RECONSTRUCTION; IMAGING SYSTEMS; ION BOMBARDMENT; LIGHT; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

DEGREE OF MONOCHROMATICITY; ELECTRON BOMBARDMENT; IMAGE PIXELS; INCIDENT X RAY BEAM; MASS ATTENUATION COEFFICIENT; MICROFOCUS X RAY SOURCES; SIMULATED X RAY SPECTRA; SPECTRAL PURITY; TOMOGRAPHIC RECONSTRUCTION; X RAY IMAGING;

X RAY SPECTROSCOPY;

EID: 0030164842     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/29/6/029     Document Type: Article

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