Electrical and microstructural characterization of Al2O3 doped LaFeO3

Journal of Materials Science Letters

Volumn 15, Issue 11, 1996, Pages 974-976

  Kuscer D ^a   Dimc, F ^a   Holc, J ^a   Hrovat, M ^a   Bernik, S ^a   Kolar, D ^a  

^a UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPOSITION; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); ELECTRIC PROPERTIES; ELECTRIC RESISTANCE MEASUREMENT; LANTHANUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SOLID ELECTROLYTES; THERMAL EXPANSION; X RAY ANALYSIS; X RAY CRYSTALLOGRAPHY;

LANTHANUM FERROUS OXIDE; MASS MAGNETIC SUSCEPTIBILITY; NEEL TEMPERATURE; PEROVSKITE PHASE; THERMAL COEFFICIENTS OF EXPANSION;

ALUMINA;

EID: 0030164814     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00241441     Document Type: Article

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