Analysis of the structural and electronic properties of (fluoranthene)2PF6 and characterization of its (011) surface by scanning tunneling microscopy

Synthetic Metals

Volumn 80, Issue 1, 1996, Pages 1-6

  Lee, K S ^a,e   Seo, D K ^a   Ren, J ^a   Whangbo, M H ^a   Magonov, S N ^b   Bar, G ^c   Brutting W ^d  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b Digital Instruments   (United States)

^c UNIVERSITY OF FREIBURG   (Germany)

^d UNIVERSITY OF BAYREUTH   (Germany)

^e The Catholic University of Korea   (South Korea)

Author keywords

Electronic properties; Fluoranthene; Microscopy; Structural properties; Surfaces

Indexed keywords

ATOMS; BAND STRUCTURE; CARRIER CONCENTRATION; CHARACTERIZATION; CRYSTAL ATOMIC STRUCTURE; ELECTRONIC PROPERTIES; MOLECULAR STRUCTURE; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; STACKING FAULTS; X RAY CRYSTALLOGRAPHY;

ANION; CHARGE DENSITY WAVE; COMPACT CRYSTAL PACKING; CONDUCTING SALTS; FLUORANTHENE;

ORGANIC CONDUCTORS;

EID: 0030164785     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/0379-6779(96)03657-0     Document Type: Article

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