Point-contact measurements for high-resolution profiling of high-resistivity III-V semiconductors

Semiconductor Science and Technology

Volumn 11, Issue 6, 1996, Pages 851-857

  Siegel, W ^a   Kuhnel G ^a   Niklas, J R ^a   Jurisch, M ^b   Hoffman, B ^b  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b FREIBERGER COMPOUND MATERIALS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRIC CONDUCTIVITY OF SOLIDS; INFRARED SPECTROSCOPY; PHOTOLUMINESCENCE; POINT CONTACTS; SEMICONDUCTING INDIUM PHOSPHIDE;

HIGH-RESOLUTION PROFILING;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0030164743     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/11/6/002     Document Type: Article

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