Origin of the φ ∼ ±9° peaks in YBa2Cu3O7-δ films grown on cubic zirconia substrates

Journal of Materials Research

Volumn 11, Issue 6, 1996, Pages 1336-1348

  Schlom, D G ^a   Hellman, E S ^b   Hartford Jr , E H ^b   Eom, C B ^b,d   Clark, J C ^a   Mannhart, J ^c  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c IBM RESEARCH ZURICH   (Switzerland)

^d Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; FILM GROWTH; NUCLEATION; OXIDE SUPERCONDUCTORS; SQUIDS; X RAY DIFFRACTION; YTTRIUM COMPOUNDS; ZIRCONIA;

CUBIC ZIRCONIA SUBSTRATES; EPITAXIAL ALIGNMENT; HETEROEPITAXIAL GROWTH; IN PLANE MISORIENTATIONS; LATTICE MATCH; YTTRIUM BARIUM CUPRATES;

SUPERCONDUCTING FILMS;

EID: 0030164612     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1996.0170     Document Type: Article

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