Epitaxial growth of Co/Cu(001) superlattices on sapphire substrates

Thin Solid Films

Volumn 279, Issue 1-2, 1996, Pages 180-188

  Di Nunzio, S ^a   Theis Brohl K ^a   Zabel, H ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Cobalt; Copper; Epitaxy; Superlattices

Indexed keywords

CHARACTERIZATION; COBALT; COPPER; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; X RAYS;

CHARACTERISTIC TILT ANGLE; COMPLEX BUFFER LAYER SYSTEM; EX SITU X RAY SCATTERING; GLANCING ANGLE SURFACE SCATTERING; HIGH ANGLE BRAGG DIFFRACTION SCANS; SAPPHIRE SUBSTRATES; SMALL ANGLE REFLECTIVITY;

METALLIC SUPERLATTICES;

EID: 0030164393     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08197-6     Document Type: Article

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