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Volumn 43, Issue 3 PART 2, 1996, Pages 1142-1145

Efficiency of non-uniformly irradiated double-sided silicon strip detectors

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITANCE; COLLIDING BEAM ACCELERATORS; COMPARATOR CIRCUITS; CYCLOTRONS; ION IMPLANTATION; IRRADIATION; PROTONS; READOUT SYSTEMS; SILICON SENSORS; SPURIOUS SIGNAL NOISE; TELESCOPES;

EID: 0030164338     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.506652     Document Type: Article
Times cited : (3)

References (16)
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  • 5
    • 0027555051 scopus 로고
    • The use of Signal Current Pulse Shape to Study the Internal Electric Field Profile and Trapping Effects in Neutron Damaged Silicon Detectors
    • H.W. Kraner and Z. Li, The use of Signal Current Pulse Shape to Study the Internal Electric Field Profile and Trapping Effects in Neutron Damaged Silicon Detectors, Nucl.Instrum. Methods A326 (1993)350-356.
    • (1993) Nucl.Instrum. Methods , vol.A326 , pp. 350-356
    • Kraner, H.W.1    Li, Z.2
  • 6
    • 0028401168 scopus 로고
    • Double-sided Microstrip Sensors for the Barrel of the SDC Silicon Tracker
    • T. Ohsugi et al, Double-sided Microstrip Sensors for the Barrel of the SDC Silicon Tracker, Nucl. Instrum. Methods A342 (1994) 16.
    • (1994) Nucl. Instrum. Methods , vol.A342 , pp. 16
    • Ohsugi, T.1
  • 7
    • 0029357307 scopus 로고
    • A Fast Shaping Low-Power Amplifier-Comparator Integrated Circuit for Silicon Strip Detectors
    • E. Spencer et al., A Fast Shaping Low-Power Amplifier-Comparator Integrated Circuit for Silicon Strip Detectors, IEEE Trans. N.S. 42 (1995) 796.
    • (1995) IEEE Trans. N.S. , vol.42 , pp. 796
    • Spencer, E.1
  • 8
    • 0003311877 scopus 로고
    • A Pipeline and Bus Interface Chip for Silicon Strip Detector Readout
    • San Francisco, CA, Nov. SCIPP 93/37
    • J. DeWitt, A Pipeline and Bus Interface Chip for Silicon Strip Detector Readout, IEEE N.S. Symp., San Francisco, CA, Nov. 1993, SCIPP 93/37.
    • (1993) IEEE N.S. Symp.
    • DeWitt, J.1
  • 9
    • 0028391944 scopus 로고
    • Temperature Dependence of the Radiation Induced Change of Depletion Voltage in Silicon PIN Detectors
    • H. Ziock, et al, Temperature Dependence of the Radiation Induced Change of Depletion Voltage in Silicon PIN Detectors, Nucl. Instrum. Methods A342 (1994) 96.
    • (1994) Nucl. Instrum. Methods , vol.A342 , pp. 96
    • Ziock, H.1
  • 10
    • 0028400372 scopus 로고
    • Reverse annealing of the effective impurity concentration and long term operational scenario for silicon detectors in future collider experiments
    • E. Fretwurst, et al, Reverse annealing of the effective impurity concentration and long term operational scenario for silicon detectors in future collider experiments, Nucl. Instrum. Methods A342 (1994) 119.
    • (1994) Nucl. Instrum. Methods , vol.A342 , pp. 119
    • Fretwurst, E.1
  • 11
    • 0009994379 scopus 로고
    • Characterization of DSSD with fast binary readout electronics using pion beams
    • San Francisco CA
    • Y. Unno et al, Characterization of DSSD with fast binary readout electronics using pion beams, IEEE N.S. Symposium, San Francisco 1995, CA
    • (1995) IEEE N.S. Symposium
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  • 13
    • 0029357444 scopus 로고
    • Signal-to-Noise in Silicon Microstrip Detectors with Binary Readout
    • J. DeWitt et al, Signal-to-Noise in Silicon Microstrip Detectors with Binary Readout, IEEE Trans. N.S. 42 (1995) 445.
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    • DeWitt, J.1
  • 15
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    • Capacitances in Silicon Microstrip Detectors
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    • Barberis, E.1
  • 16
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    • Signal Simulations for double-sided Silicon Strip Detectors
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.