Pb/p-PbSe junction: An investigation of current-voltage and capacitance-voltage measurements

Solid-State Electronics

Volumn 39, Issue 6, 1996, Pages 813-819

  Dos Santos, O ^a   Mathet, V ^a   Fau, C ^a   Charar, S ^a   Averous, M ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CRYSTAL IMPURITIES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; LEAD; MOLECULAR BEAM EPITAXY; OHMIC CONTACTS; OPTICAL SENSORS; PHOTOLITHOGRAPHY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING LEAD COMPOUNDS; ULTRATHIN FILMS;

CAPACITANCE VOLTAGE MEASUREMENTS; CURRENT VOLTAGE MEASUREMENTS; FERMI-DIRAC STATISTICS; IMPURITY CONCENTRATIONS; PHOTOVOLTAIC SENSORS; SCHOTTKY BARRIER HEIGHT;

HETEROJUNCTIONS;

EID: 0030164196     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(95)00398-3     Document Type: Article

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