메뉴 건너뛰기




Volumn 16, Issue 6-8, 1996, Pages 265-398

Novel features of photoluminescence spectra from acceptor-doped GaAs: Formation of acceptor-acceptor pair emissions and optical compensation effect

Author keywords

Acceptor acceptor pair emissions; Gallium arsenide; Optical compensation effect; Photoluminescence

Indexed keywords

CRYSTAL IMPURITIES; ELECTRON EMISSION; EPITAXIAL GROWTH; ION BEAMS; IONS; LIQUID PHASE EPITAXY; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DOPING; SEMICONDUCTOR MATERIALS; SUBSTRATES;

EID: 0030163928     PISSN: 0927796X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-796X(95)00189-1     Document Type: Article
Times cited : (14)

References (316)
  • 2
    • 77957062535 scopus 로고
    • R.K. Willardson and A.C. Beer (eds.), Academic, New York
    • H.B. Bebb and E.W. Williams, in R.K. Willardson and A.C. Beer (eds.), Semiconductors and Semimetals, Vol. 8, Academic, New York, 1972, p. 181; E.W. Williams and H.B. Bebb, in R.K. Willardson and A.C. Beer (eds.), Semiconductor and Semimetals, Vol. 8, Academic, New York, 1972, p. 321.
    • (1972) Semiconductors and Semimetals , vol.8 , pp. 181
    • Bebb, H.B.1    Williams, E.W.2
  • 3
    • 77957078386 scopus 로고
    • R.K. Willardson and A.C. Beer (eds.), Academic, New York
    • H.B. Bebb and E.W. Williams, in R.K. Willardson and A.C. Beer (eds.), Semiconductors and Semimetals, Vol. 8, Academic, New York, 1972, p. 181; E.W. Williams and H.B. Bebb, in R.K. Willardson and A.C. Beer (eds.), Semiconductor and Semimetals, Vol. 8, Academic, New York, 1972, p. 321.
    • (1972) Semiconductor and Semimetals , vol.8 , pp. 321
    • Williams, E.W.1    Bebb, H.B.2
  • 10
    • 0021375562 scopus 로고
    • P.J. Dean, M.S. Skolnick, B. Cockayne, W.R. MacEwan and G.W. Iseler, J. Cryst. Growth, 67 (1984) 486; P.J. Dean, M.S. Skolnick and L.L. Taylor, J. Appl: Phys., 55 (1984) 957; M.S. Skolnick, P.J. Dean, S.H. Groves and E. Kuphal, Appl. Phys. Lett., 45 (1984) 962.
    • (1984) J. Appl: Phys. , vol.55 , pp. 957
    • Dean, P.J.1    Skolnick, M.S.2    Taylor, L.L.3
  • 11
    • 0021529543 scopus 로고
    • P.J. Dean, M.S. Skolnick, B. Cockayne, W.R. MacEwan and G.W. Iseler, J. Cryst. Growth, 67 (1984) 486; P.J. Dean, M.S. Skolnick and L.L. Taylor, J. Appl: Phys., 55 (1984) 957; M.S. Skolnick, P.J. Dean, S.H. Groves and E. Kuphal, Appl. Phys. Lett., 45 (1984) 962.
    • (1984) Appl. Phys. Lett. , vol.45 , pp. 962
    • Skolnick, M.S.1    Dean, P.J.2    Groves, S.H.3    Kuphal, E.4
  • 19
    • 4243996758 scopus 로고
    • J.P. Salerno, E. Koteles, J.V. Gormley, B.J. Sowell, E.M. Brody, J.Y. Chi and R.P. Holmstrom, J. Vac. Sci. Technol. B, 3 (1985) 618; E.S. Koteles, J. Lee, J.P. Salerno and M.O. Vassel, Phys. Rev. Lett., 55 (1985) 867.
    • (1985) Phys. Rev. Lett. , vol.55 , pp. 867
    • Koteles, E.S.1    Lee, J.2    Salerno, J.P.3    Vassel, M.O.4
  • 33
    • 0001159990 scopus 로고
    • H. Künzel and K. Ploog, Appl. Phys. Lett., 37 (1980) 416; Inst. Phys. Conf. Ser., 56 (1981) 519.
    • (1981) Inst. Phys. Conf. Ser. , vol.56 , pp. 519
  • 51
    • 30244556253 scopus 로고    scopus 로고
    • in press
    • M. Mori, Y. Makita, N. Ohnishi, S. Shigetomi, H. Tanaka, H. Yokohama, H.C. Lee, T. Nomura, T. Matsumori and T. Izumi, Report of Research Center of Ion Beam Technology, Hosei University, 5th Symp. on Ion Beam Technology, Suppl. 5, 1987, p. 69; Y. Kawasumi, Y. Makita, S. Kimura, T. Iida, S. Uekusa and T. Tsukamotao, Mat. Res. Soc., in press.
    • Mat. Res. Soc.
    • Kawasumi, Y.1    Makita, Y.2    Kimura, S.3    Iida, T.4    Uekusa, S.5    Tsukamotao, T.6
  • 87
    • 30244480308 scopus 로고
    • W. Heinke and H.J. Queisser, Phys. Rev. Lett., 33 (1974) 1082; M. Grundmann, J. Christen, D. Bimberg, A. Hashimoto, T.Fukunaga and N. Watanabe, Appl. Phys. Lett., 58 (1991) 2090.
    • (1974) Phys. Rev. Lett. , vol.33 , pp. 1082
    • Heinke, W.1    Queisser, H.J.2
  • 165
    • 30244514842 scopus 로고
    • D.M. Collins, Appl. Phys. Lett., 35 (1979) 67; D.M. Collins, J.N. Miller, Y.G. Chai and R. Chow, J. Appl. Phys., 53 (1982) 3010.
    • (1979) Appl. Phys. Lett. , vol.35 , pp. 67
    • Collins, D.M.1
  • 193
    • 36549101636 scopus 로고
    • C.R. Abernathy, S.J. Pearton, F. Ren, W.S. Hobson, T.R. Fullowan, A. Katz, A.S. Jordan and J. Kovalchick, J. Cryst. Growth, 105 (1990) 375; S.J. Pearton and C.R. Abernathy, Appl. Phys. Lett., 55 (1989) 678.
    • (1989) Appl. Phys. Lett. , vol.55 , pp. 678
    • Pearton, S.J.1    Abernathy, C.R.2
  • 208
    • 84937562212 scopus 로고
    • A.C. Gossard (ed.), Academic Press, New York
    • T. Ishibashi, in A.C. Gossard (ed.), Semiconductors and Semimetals, Vol.41, Academic Press, New York, 1994, p. 250.
    • (1994) Semiconductors and Semimetals , vol.41 , pp. 250
    • Ishibashi, T.1
  • 215
    • 0343077592 scopus 로고
    • R.E. Willardson and A.C. Beer (eds.), Academic, New York
    • W.G. Spitzer, in R.E. Willardson and A.C. Beer (eds.), Semiconductors and Semimetals, Vol. 3, Academic, New York, 1967, p. 17.
    • (1967) Semiconductors and Semimetals , vol.3 , pp. 17
    • Spitzer, W.G.1
  • 245
    • 0024765115 scopus 로고
    • D.K. Brice, J.Y. Tsao and S.T. Picraux, Nucl. Instrum. Methods B, 44 (1989) 68; E. Chason, P. Bedrossian, K.M. Horn, J.Y. Tsao and S.T. Picraux, Appl. Phys. Lett., 57 (1990) 1793; T.E. Haynes, R.A. Zuhr, S.J. Pennycook and B.R. Appleton, Appl. Phys. Lett., 54 (1989) 1439.
    • (1989) Nucl. Instrum. Methods B , vol.44 , pp. 68
    • Brice, D.K.1    Tsao, J.Y.2    Picraux, S.T.3
  • 246
    • 36549104730 scopus 로고
    • D.K. Brice, J.Y. Tsao and S.T. Picraux, Nucl. Instrum. Methods B, 44 (1989) 68; E. Chason, P. Bedrossian, K.M. Horn, J.Y. Tsao and S.T. Picraux, Appl. Phys. Lett., 57 (1990) 1793; T.E. Haynes, R.A. Zuhr, S.J. Pennycook and B.R. Appleton, Appl. Phys. Lett., 54 (1989) 1439.
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 1793
    • Chason, E.1    Bedrossian, P.2    Horn, K.M.3    Tsao, J.Y.4    Picraux, S.T.5
  • 247
    • 0347218719 scopus 로고
    • D.K. Brice, J.Y. Tsao and S.T. Picraux, Nucl. Instrum. Methods B, 44 (1989) 68; E. Chason, P. Bedrossian, K.M. Horn, J.Y. Tsao and S.T. Picraux, Appl. Phys. Lett., 57 (1990) 1793; T.E. Haynes, R.A. Zuhr, S.J. Pennycook and B.R. Appleton, Appl. Phys. Lett., 54 (1989) 1439.
    • (1989) Appl. Phys. Lett. , vol.54 , pp. 1439
    • Haynes, T.E.1    Zuhr, R.A.2    Pennycook, S.J.3    Appleton, B.R.4
  • 269
    • 0009623890 scopus 로고
    • Characterization and properties of semiconductors
    • T.S. Moss and S. Mahajan (eds.), North Holland, Amsterdam
    • G.E. Stillman, S.S. Bose, M.H. Kim, B. Lee and T.S. Low, Characterization and Properties of Semiconductors, in T.S. Moss and S. Mahajan (eds.), Handbook of Semiconductors, Vol. 3, North Holland, Amsterdam, 1994, p. 783.
    • (1994) Handbook of Semiconductors , vol.3 , pp. 783
    • Stillman, G.E.1    Bose, S.S.2    Kim, M.H.3    Lee, B.4    Low, T.S.5
  • 279
    • 33845262265 scopus 로고
    • R.K. Willardson and A.C. Beer (eds.), Academic New York
    • D.L. Rode, in R.K. Willardson and A.C. Beer (eds.), Semiconductors and Semimetals, Vol. 10, Academic New York, 1975, p. 71.
    • (1975) Semiconductors and Semimetals , vol.10 , pp. 71
    • Rode, D.L.1
  • 316
    • 0344390361 scopus 로고
    • S.T. Pantelides (ed.), Gordon and Breach, New York
    • P.J. Dean, in S.T. Pantelides (ed.), Deep Centers in Semiconductors, Gordon and Breach, New York, 1986, p. 185.
    • (1986) Deep Centers in Semiconductors , pp. 185
    • Dean, P.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.