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Volumn 16, Issue 2, 1996, Pages 91-96

An automated swept power supply for a langmuir probe

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED SWEPT POWER SUPPLY; DATA ACQUISITION CARD; LANGMUIR PROBE; PLASMA CONDITIONS;

EID: 0030156830     PISSN: 07252986     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (6)
  • 1
    • 0003072237 scopus 로고
    • Electric Probes
    • edited by Huddlestone, R.H. and Leonard, S.L., Academic Press
    • Chen, F.F., Electric Probes, In Plasma Diagnostic Techniques, edited by Huddlestone, R.H. and Leonard, S.L., Academic Press (1965) pp113-117.
    • (1965) Plasma Diagnostic Techniques , pp. 113-117
    • Chen, F.F.1
  • 3
    • 0042241567 scopus 로고
    • Design and Evaluation of a Computer Controlled Langmuir Probe System for Glow Discharges Plasma Diagnostics
    • Fang, D., Williams, R.R. and Marcus, R.K., Design and Evaluation of a Computer Controlled Langmuir Probe System for Glow Discharges Plasma Diagnostics, J Anal Atomic Spec, 5 (1990) 569-573.
    • (1990) J Anal Atomic Spec , vol.5 , pp. 569-573
    • Fang, D.1    Williams, R.R.2    Marcus, R.K.3
  • 4
    • 0000202672 scopus 로고
    • A Workstation based Langmuir Probe system for Low-Pressure CD Plasmas
    • Sudit, I.D. and Woods R.C., A Workstation based Langmuir Probe system for Low-Pressure CD Plasmas, Rev Sci Instrum. 64 (1993) 2440-2448.
    • (1993) Rev Sci Instrum. , vol.64 , pp. 2440-2448
    • Sudit, I.D.1    Woods, R.C.2
  • 5
    • 0038979891 scopus 로고
    • Automatic Langmuir Probe Diagnostic
    • Hopkins, M.B., et al, Automatic Langmuir Probe Diagnostic, Rev Sci Instrum., 58 (1987) 475-476.
    • (1987) Rev Sci Instrum. , vol.58 , pp. 475-476
    • Hopkins, M.B.1
  • 6
    • 0026907786 scopus 로고
    • Apparatus for Langmuir Probe Monitoring of Plasma during Deposition Processes
    • Spatenka, P., Studeny, R. and Suhr, H., Apparatus for Langmuir Probe Monitoring of Plasma during Deposition Processes, Meas. Sci. Technol., 3 (1992) 704-706.
    • (1992) Meas. Sci. Technol. , vol.3 , pp. 704-706
    • Spatenka, P.1    Studeny, R.2    Suhr, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.