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Volumn 12, Issue 13, 1996, Pages 3341-3350

Investigations on the influence of adhesion, cohesion, and external forces on the formation of ultrathin polymeric films

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; FILM PREPARATION; PLASTIC FILMS; POLYMERS;

EID: 0030156739     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9510801     Document Type: Article
Times cited : (13)

References (65)
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    • A forthcoming publication
    • A forthcoming publication by T. Gesang, R. Höper, W. Possart, and O.-D. Hennemann details the initial stages of the prepolymer growth process on silicon wafers.
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    • note
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    • For rough substrates, the borderline angle is defined in a similar way: cf. ref 47
    • For rough substrates, the borderline angle is defined in a similar way: cf. ref 47.
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    • Latest results even show this for the minute topography of the silicon wafers: ref 42
    • Latest results even show this for the minute topography of the silicon wafers: ref 42.
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    • note
    • A lower prepolymer cohesion is unlikely to occur, because the cohesion is expected to be independent of the substrate material unless there should be a nonadditivity of the molecular forces involved.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.